Short Course #4 Atomic Force Microscopy for Energy Research Applications and Electrochemistry
Keith Jones, Instructor
Please visit the Toronto meeting page for registration information. Early-Bird Registration rates are in effect until April 12, 2013. See a list of all Short courses offered at the Toronto meeting.
This course is intended for chemists, physicists, and materials scientists that want to understand how Atomic Force Microscopy (AFM) can be used to characterize materials and to probe electrochemical processes and ionic transport in solids for a broad range of applications for energy generation and storage ranging from batteries to fuel cells. A new technique called Electrochemical Strain Microscopy (ESM) will be introduced. ESM, developed by Oak Ridge National Laboratory, is an innovative new AFM/SPM technique that is capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level. Students will learn the science behind the technique, how it works, and the advantages of this technique over other methods. Current ESM results will also be presented and general AFM tips and tricks for electrochemistry applications.
Introduction to AFM
Instrumentation and scanning modes
Challenges in battery/energy research characterization
Introduction to the ESM technique
Advantages of the technique over others
Current research and image examples
Tips and tricks for AFM electrochemistry measurements
About the Instructor
Keith Jones has over 14 years of AFM experience and is currently an Applications Scientist at Asylum Research, Santa Barbara, CA focusing on AFM and the electrical characterization materials and general material science applications. Previously, he was an Application Scientist at Veeco (Bruker), where he developed AFM application modules used to electrically test and characterize semiconductors, conductors and insulators in materials and devices. He has held various Research Assistant positions at Virginia Commonwealth University in both the Electrical Engineering and Physics departments. He received his MS in Applied Physics from Virginia Commonwealth University in 2000. Mr. Jones has been published in peer-reviewed journals for papers on AFM and materials topics.