Workshop on Defects in Wide Band Gap Semiconductors
September 23, 2014
University of Maryland, College Park
Call for abstracts.
CALL FOR ABSTRACTS
Abstracts accepted in the following categories:
GALLIUM NITRIDE AND SILICON CARBIDE AND RELATED COMPOUNDS
- Origin of defects in wide band-gap semiconductors
- Extended defects in wide band-gap semiconductors
- Defect reduction strategies
- Atomic level control of material growth
- Growth optimization and growth yield
- Defect dynamics in extreme environments
WIDE BANDGAP POWER DEVICES
- Defect-device performance-reliability correlations
- Defect-manufacturing yield correlations
- Role of defects in wide bandgap power electronics
- Defect modeling and defect-device performance models
- Defect characterization, in-situ and in real time
- Advanced defect characterization in both ground and excited states
- Defect modeling in ground and excited states
- Manufacturing yield and cost reduction strategies
Instructions and submission template.
DEADLINE JULY 28
